Systems and Method for Providing Voltage Compensation for single-photon avalanche diodes

ABSTRACT

The present invention is directed to electrical circuits and methods. According to a specific embodiment, the present invention provides a voltage compensation mechanism for one or more single-phone avalanche diodes (SPADs). A reference voltage is generated based at least on an operating voltage of the SPADs. The reference voltage is coupled to a charge pump that generates a compensation voltage for the diodes. There are other embodiments as well.

CROSS-REFERENCES TO RELATED APPLICATIONS

The present application claims priority to Chinese Patent Application No. 202111653198.x, filed Dec. 30, 2021, which is common own and incorporated by reference herein for all purposes.

BACKGROUND OF THE INVENTION

The present invention relates to the field of electrical circuit.

Lidar, or Light Detection and Ranging, is a remote sensing technology that uses lasers to measure the distance to a target. Lidar systems emit laser pulses and measure the time it takes for the pulses to reflect off the target and return to the sensor. This information is used to create high-resolution 3D maps of the target area, with applications in fields such as self-driving vehicles, aerial mapping, and environmental monitoring. Lidar technology has its roots in the 1960s, when it was first developed for use in meteorology and atmospheric research. However, it was not until the development of low-cost, high-speed laser sensors and improved data processing algorithms in the early 2000s that lidar became widely adopted in commercial and industrial applications. Lidar systems utilize principle of direct time of flight, where a flight distance of a photon is calculated by calculating a difference between emitting time of light and receiving time of the light, so as to calculate a distance to a detected target and generate a depth image containing depth information of the target. The depth map technology may be widely used in the field of consumer electronics, for example, assisted/unmanned driving and augmented reality/virtual reality (AR/VR). In this specific detection system, a light-emitting unit is generally a light-emitting diode (LED), a laser diode (LED), a vertical cavity surface emitting laser, or the like.

Lidar SPAD, or Single-Photon Avalanche Diode, is a type of photodetector used in lidar systems. Lidar SPADs are designed to detect single photons of light, allowing them to measure the distance to a target with high accuracy and resolution. SPADs work by using a p-n junction, a type of semiconductor device, to create an avalanche breakdown effect. When a photon of light is absorbed by the SPAD, it generates a current of electrons that can be detected and measured. The time it takes for the current to be detected can be used to calculate the distance to the target, allowing the lidar system to build a 3D map of the environment. SPADs are highly sensitive and can operate at high speeds, making them ideal for use in lidar systems. They are typically used in combination with other sensors and algorithms to provide accurate and reliable 3D mapping data.

In operation, the light-emitting unit emits a beam string toward a specified direction. After the flying beam encounters an object and is reflected, some photons return back over the same way. When the beam string is emitted, a reverse high voltage (for example, 27V) is applied to two ends of the light receiving unit (for example, the SPAD) to make it in a breakdown critical state. Once the light receiving unit is hit by the returned photons, an avalanche effect is generated. In addition, an electrical signal is generated, so that flight time of the photons and the distance to the target can be calculated.

An important component of a lidar system is voltage supply that provide voltage to the SPAD module. Over the past, various conventional voltage supplies were implemented in lidar systems, but they are inadequate.

Therefore, new and improved lidar voltage supplies are desired.

BRIEF SUMMARY OF THE INVENTION

The present invention is directed to electrical circuits and methods. According to a specific embodiment, the present invention provides a voltage compensation mechanism for one or more single-phone avalanche diodes (SPADs). A reference voltage is generated based at least on an operating voltage of the SPADs. The reference voltage is coupled to a charge pump that generates a compensation voltage for the diodes. There are other embodiments as well.

According to an embodiment, the present invention provides reference voltage generation module with an adjustable temperature coefficient is provided, including:

a band gap reference unit, configured to output a bias current with a positive temperature coefficient and a first voltage with a negative temperature coefficient, where the bias current flows through a bias resistor to form a bias voltage; and

a temperature coefficient adjustment unit, configured to output an initial reference voltage with an adjustable temperature coefficient according to the bias voltage, the first voltage, and a first output value of an external register.

Preferably, the reference voltage generation module with an adjustable temperature coefficient further includes:

the band gap reference unit being further configured to output a second voltage with a temperature coefficient of 0;

a voltage adjustment unit, configured to output a compensation voltage according to the second voltage and a second output value of the external register; and

a voltage superimposing unit, configured to superimpose the initial reference voltage and the compensation voltage and output a reference voltage.

Preferably, the temperature coefficient adjustment unit includes: a first initial resistor, a first base resistor, at least first optional voltage divider resistors, and first gating switches configured to connect nodes of the corresponding first optional voltage divider resistors to the initial reference voltage, where one end of the first initial resistor is connected to one end of the bias voltage, an other end of the first initial resistor is connected to one end of the first base resistor by the first optional voltage divider resistors, an other end of the first base resistor is connected to a first voltage output end of the band gap reference unit, the first optional voltage divider resistors are connected to the initial reference voltage by the first gating switches, and closing of the corresponding first gating switches is controlled by using the first output value of the external register, to change a voltage value of the initial reference voltage.

Preferably, the voltage adjustment unit includes a first operational amplifier, an adjustable feedback subunit, and a feedback resistor, where an in-phase input end of the first operational amplifier is connected to a second voltage output end of the band gap reference unit, an inverting input end of the first operational amplifier is connected to an output end of the first operational amplifier by the adjustable feedback subunit to output the compensation voltage and is also grounded by the feedback resistor, and the adjustable feedback subunit adjusts a resistance value of the adjustable feedback subunit according to the second output value of the external register.

Preferably, the adjustable feedback subunit includes a second initial resistor, a second base resistor, at least a second optional voltage divider resistor connected in series between the second initial resistor and the second base resistor, and a second gating switch configured to short-circuit a corresponding second optional voltage divider resistor, where one end of the second initial resistor is connected to the output end of the first operational amplifier, an other end of the second initial resistor is sequentially connected to one end of the feedback resistor and the inverting input end of the first operational amplifier by the second optional voltage divider resistor and the second base resistor, one end of the second optional voltage divider resistor is connected to one end of the second base resistor by the second gating switch, and closing of a corresponding second gating switch is controlled by using the second output value of the external register, to change the resistance value of the feedback subunit.

Preferably, the voltage superimposing unit includes a second operational amplifier, two first positive feedback resistors, a second positive feedback resistor, and two negative feedback resistors, where a non-inverting input end of the second operational amplifier is connected to an output end of the voltage adjustment unit by one first positive feedback resistor, and is also connected to an output end of the temperature coefficient adjustment unit by the other first positive feedback resistor, and is further grounded by the second positive feedback resistor, and an inverting input end of the second operational amplifier is connected to an output end of the second operational amplifier by one negative feedback resistor and is also grounded by the other negative feedback resistor.

Preferably, a first voltage follower is arranged between a bias current output end of the band gap reference unit and the temperature coefficient adjustment unit, a second voltage follower is arranged between a first voltage output end of the band gap reference unit and the temperature coefficient adjustment unit, and/or a third voltage follower is arranged on an output end of the voltage superimposing unit.

Preferably, the first output value and the second output value are outputted by a same register or different registers.

Certain embodiments of the present invention further provide a power supply apparatus with an adjustable temperature coefficient, including:

a reference voltage generation module, configured to adjust a temperature coefficient of an output voltage thereof, compensate a voltage difference generated due to adjustment of the temperature coefficient, and finally output a reference voltage; and

a charge pump, a first voltage feedback resistor, a second voltage feedback resistor, and a comparator, where a non-inverting input end of the comparator is connected to the reference voltage, a inverting input end of the comparator is grounded by the first voltage feedback resistor and is connected to an output end of the charge pump by the second voltage feedback resistor, an output end of the comparator is used as an input end of the charge pump, and the output end of the charge pump is used as an output end of the power supply apparatus.

One general aspect includes a compensation system for a single-photon avalanche diode (SPAD). The compensation system also includes a reference voltage circuit coupled to a first input terminal and a second input terminal, the first input terminal being coupled to a reference temperature value associated with a breakdown voltage of the SPAD, the second input terminal being coupled to an operating temperature value, the reference voltage circuit being configured generate a reference voltage based at least on a difference between the reference temperature value and the operating temperature value. The system also includes a comparator circuit may include a first input and a second input, the comparator circuit being configured to generate an intermediate voltage. The system also includes a charge pump circuit configured to provide a temperature compensation voltage based at least on the intermediate voltage. The system also includes a first resistor coupled to the charge pump circuit and the second input of the comparator circuit.

Implementations may include one or more of the following features. The system where the SPAD is couple to an SPAD array may include a plurality of SPAD units. The system may include a second resistor configured in series relative to the first resistor, the second resistor being grounded. The spad is coupled to the temperature compensation voltage, the SPAD being configured in parallel relative to the first resistor and the second resistor. The second input of the comparator circuit may include an inverted input. The reference voltage circuit may include a first plurality of switches for generating a first voltage and second plurality of switches for generating a second voltage, first plurality of switches being coupled to a first plurality of control bits based on the reference temperature value, the second plurality of switches being coupled to a second plurality of control bits based on the operating temperature value. The first plurality of switches is coupled to a first plurality of corresponding resistors, and the second plurality of switches is coupled to a second plurality of corresponding resistors. The reference voltage circuit may include: a bandgap reference circuit configured to generate intermediate reference voltages; a temperature coefficient adjustment circuit coupled to the bandgap reference circuit, the temperature coefficient adjustment circuit being configured generate a first intermediate reference voltage based at least on the operating temperature value; a voltage adjustment circuit coupled to the bandgap reference circuit, the voltage adjustment circuit being configured generate a second intermediate reference voltage based at least on the reference temperature value; and a voltage superimposing circuit configured to generate a third intermediate reference voltage using at least the first intermediate reference voltage and the second intermediate reference voltage.

Another general aspect includes a reference voltage circuit for providing a reference voltage in a lidar system. The reference voltage circuit also includes a bandgap reference circuit configured to generate intermediate reference voltages, the bandgap reference circuit may include a plurality of bipolar junction transistors (BJTs) for providing a current proportional to absolute temperature. The circuit also includes a temperature coefficient adjustment circuit coupled to the bandgap reference unit, the temperature coefficient adjustment circuit being configured generate a first intermediate reference voltage based at least on an operating temperature value. The circuit also includes a voltage adjustment circuit coupled to the bandgap reference unit, the voltage adjustment circuit being configured generate a second intermediate reference voltage based at least on a reference temperature value. The circuit also includes a voltage superimposing circuit configured to generate a third intermediate reference voltage using at least the first intermediate reference voltage and the second intermediate reference voltage.

Implementations may include one or more of the following features. The circuit where the temperature coefficient adjustment circuit may include a first plurality of switches corresponding to a first plurality of resistors, the first plurality of switches being configured to operate according to the operating temperature value. The voltage adjustment circuit may include a second plurality of switches corresponding to a second plurality of resistors, the second plurality of switches being configured to operate according to the reference temperature value. The circuit the voltage adjustment circuit may include an operational amplifier and a voltage divider circuit. The voltage divider circuit may include a variable resistor. Implementations of the described techniques may include hardware, a method or process, or computer software on a computer-accessible medium.

Yet another general aspect includes a compensation system for a single-photon avalanche diode (SPAD) array. The compensation system also includes a reference voltage circuit coupled to a first input terminal and a second input terminal, the first input terminal being coupled to a reference temperature value associated with a breakdown voltage of the SPAD array, the second input terminal being coupled to an operating temperature value, the reference voltage circuit being configured generate a reference voltage based at least on a difference between the reference temperature value and the operating temperature value. The system also includes a comparator circuit may include a first input and a second input, the comparator is configured to generate an intermediate voltage. The system also includes a charge pump circuit configured to provide a temperature compensation voltage based at least on the intermediate voltage. The system also includes where the reference voltage circuit may include: a temperature coefficient adjustment circuit coupled configured generate a first intermediate reference voltage based at least on the operating temperature value, and a voltage adjustment circuit configured generate a second intermediate reference voltage based at least on the reference temperature value.

Implementations may include one or more of the following features. The system where the reference voltage circuit further may include a bandgap reference circuit configured to generate intermediate reference voltages, the bandgap reference circuit may include a plurality of bipolar junction transistors (BJTs) for providing a current proportional to absolute temperature. The reference voltage circuit further may include a voltage superimposing circuit configured to generate a third intermediate reference voltage using at least the first intermediate reference voltage and the second intermediate reference voltage. The system may include a first resistor and a second resistor the first resistor being coupled to the charge pump circuit and the second input of the comparator circuit. The reference voltage circuit may include a first plurality of switches for generating a first voltage and second plurality of switches for generating a second voltage, first plurality of switches being coupled to a first plurality of control bits based on the reference temperature value, the second plurality of switches being coupled to a second plurality of control bits based on the operating temperature value. The system may include a register for storing the reference voltage value. The temperature coefficient adjustment circuit is coupled to a voltage proportional to absolute temperature.

An exemplary embodiment of present invention further provides a laser ranging chip, including at least one photoelectric detector array and a power supply apparatus, where a negative electrode of the photoelectric detector array is connected to an output end of the power supply apparatus, and a positive electrode of the photoelectric detector array is grounded.

Compared to existing techniques, in the reference voltage generation module, the power supply apparatus, and the laser ranging chip provided in the present invention, a band gap reference unit outputs a bias current with a positive temperature coefficient and a first voltage with a negative temperature coefficient, where the bias current flows through a bias resistor to form a bias voltage, and a temperature coefficient adjustment unit outputs an initial reference voltage with an adjustable temperature coefficient according to the bias voltage, the first voltage, and a first output value of an external register, so that an output voltage of the reference voltage generation module can be adjusted according to a temperature coefficient, to change the output voltage with temperature. When the voltage is loaded on a photoelectric detector array, the voltage may be a voltage when the photoelectric detector array breaks down a critical state, to ensure a light sensing capability and detection accuracy of the photoelectric detector array.

The present invention achieves these benefits and others in the context of known technology. However, a further understanding of the nature and advantages of the present invention may be realized by reference to the latter portions of the specification and attached drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic diagram of a circuit principle of a reference voltage generation module with an adjustable temperature coefficient according to the present invention.

FIG. 2 is a schematic diagram of a circuit of a band gap reference unit in a reference voltage generation module according to the present invention.

FIG. 3 is a schematic diagram of a circuit of a temperature coefficient adjustment unit in a reference voltage generation module according to the present invention.

FIG. 4 is a schematic diagram of a circuit of a voltage adjustment unit in a reference voltage generation module according to the present invention.

FIG. 5 is a schematic diagram of a circuit of an adjustable feedback subunit in a reference voltage generation module according to the present invention.

FIG. 6 is a schematic diagram of a circuit of a voltage superimposing unit in a reference voltage generation module according to the present invention.

FIG. 7 is a schematic diagram of a circuit principle of a power supply apparatus with an adjustable temperature coefficient according to the present invention.

DETAILED DESCRIPTION OF THE INVENTION

The present invention is directed to electrical circuits and methods. According to a specific embodiment, the present invention provides a voltage compensation mechanism for one or more single-phone avalanche diodes (SPADs). A reference voltage is generated based at least on an operating voltage of the SPADs. The reference voltage is coupled to a charge pump that generates a compensation voltage for the diodes. There are other embodiments as well.

As mentioned above, existing voltage supplies for lidar systems are inadequate. For example, temperature can affect the sensitivity of a SPAD in a few ways. Temperature can affect the quantum efficiency of a SPAD, which is the proportion of incident photons that are detected by the device. As the temperature decreases, the quantum efficiency typically increases, leading to higher sensitivity. Temperature can also affect the dark count rate of a SPAD, which is the number of false detections that occur in the absence of incident photons.

As the temperature decreases, the dark count rate typically decreases, leading to higher sensitivity. Temperature can affect the noise performance of SPAD, which determines how accurately the device can detect low-intensity signals. As temperature increases, the bread down voltage of a SPAD in lidar typically decreases. This is because higher temperatures can cause the SPAD to become more susceptible to breakdown, leading to a lower breakdown voltage. Additionally, high temperatures can also cause the SPAD to become more sensitive to light, leading to a lower breakdown voltage. This can affect the accuracy and performance of the lidar system. As an example, a source voltage provided by the system to the two ends of the SPAD is constant, for example, 27V. However, a breakdown (BD) voltage on the two ends of the SPAD changes with temperature. If the temperature rises, causing V_(BD) (that is, the breakdown voltage) to rise to, for example, 27.5V, the SPAD that is originally in the breakdown critical state is in a sub-avalanche state. In this case, even if reflected light is emitted to the SPAD, an avalanche effect is not caused, which reduces a light sensing capability and detection accuracy. It is to be appreciated that embodiments of the present invention compensate temperature-related SPAD variation by adjusting the SPAD supply voltage accordingly.

The following description is presented to enable one of ordinary skill in the art to make and use the invention and to incorporate it in the context of particular applications. Various modifications, as well as a variety of uses in different applications will be readily apparent to those skilled in the art, and the general principles defined herein may be applied to a wide range of embodiments. Thus, the present invention is not intended to be limited to the embodiments presented, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

In the following detailed description, numerous specific details are set forth in order to provide a more thorough understanding of the present invention. However, it will be apparent to one skilled in the art that the present invention may be practiced without necessarily being limited to these specific details. In other instances, well-known structures and devices are shown in block diagram form, rather than in detail, in order to avoid obscuring the present invention.

The reader's attention is directed to all papers and documents which are filed concurrently with this specification and which are open to public inspection with this specification, and the contents of all such papers and documents are incorporated herein by reference. All the features disclosed in this specification, (including any accompanying claims, abstract, and drawings) may be replaced by alternative features serving the same, equivalent or similar purpose, unless expressly stated otherwise. Thus, unless expressly stated otherwise, each feature disclosed is one example only of a generic series of equivalent or similar features.

Furthermore, any element in a claim that does not explicitly state “means for” performing a specified function, or “step for” performing a specific function, is not to be interpreted as a “means” or “step” clause as specified in 35 U.S.C. Section 112, Paragraph 6. In particular, the use of “step of” or “act of” in the Claims herein is not intended to invoke the provisions of 35 U.S.C. 112, Paragraph 6.

Please note, if used, the labels left, right, front, back, top, bottom, forward, reverse, clockwise and counter clockwise have been used for convenience purposes only and are not intended to imply any particular fixed direction. Instead, they are used to reflect relative locations and/or directions between various portions of an object.

A reference voltage generation module with an adjustable temperature coefficient provided in the present invention may generate a reference voltage and input the reference voltage to a charge pump for power supply, and is mainly configured to enable an output voltage of the charge pump to change with temperature, to ensure that the output voltage thereof is loaded on a single photon avalanche diode (SPAD) array, so as to enable the SPAD to enter an avalanche critical point state.

Referring to FIG. 1 , the reference voltage generation module with an adjustable temperature coefficient in the present invention includes band gap reference unit 11 and temperature coefficient adjustment unit 12. The band gap reference unit 11 is connected to the temperature coefficient adjustment unit 12.

The band gap reference unit 11 is configured to output a bias current I_(ref1) with a positive temperature coefficient and a first voltage V_(be) with a negative temperature coefficient, where the bias current I_(ref1) flows through a bias resistor R to form a bias voltage V_(ptat). The temperature coefficient adjustment unit 12 is configured to output an initial reference voltage V_(ref1) with an adjustable temperature coefficient to a charge pump for power supply according to the bias voltage V_(ptat), the first voltage V_(be), and a first output value of an external register, so that a voltage outputted by the charge pump changes with temperature, and the output voltage of the charge pump is synchronized with a change of a light receiving sensor, thereby greatly improving stability, a light sensing capability and a detection effect of the light receiving sensor when the temperature changes. As an example, the term “PTAT” refers to voltage or current value that is proportional to absolute temperature, which is useful for providing compensation voltage to SPAD circuits.

Still referring to FIG. 1 , the reference voltage generation module with an adjustable temperature coefficient in the present invention further includes voltage adjustment unit 13 and a voltage superimposing unit 14. The voltage adjustment unit 13 is connected to the band gap reference unit 11, an input end of the voltage superimposing unit 14 is connected to the temperature coefficient adjustment unit 12, and another input end of the voltage superimposing unit 14 is connected to the voltage adjustment unit 13.

The band gap reference unit 11 is further configured to output a second voltage V_(bg) (that is, a reference voltage V_(bg)) with a temperature coefficient of 0. The voltage adjustment unit 13 is configured to output a compensation voltage V_(ref0) according to the second voltage V_(bg) and a second output value of the external register. The voltage superimposing unit 14 is configured to superimpose the initial reference voltage V_(ref1) and the compensation voltage V_(ref0) and output a reference voltage V_(ref), where a temperature coefficient of the reference voltage V_(ref) is adjustable.

Referring to FIG. 2 , in an exemplary embodiment, there are three output signals in the band gap reference unit 11. A first signal is the reference voltage V_(BG) with a temperature coefficient of 0, where first signal is calculated using the equation below:

${VBG} = {V_{{BE}3} + {\frac{V_{T}\ln n}{R01}*R02}}$

A second signal is a current I_(PTAT) that is in direct proportion to an absolute temperature, where a calculation formula for the second signal is as follows:

$I_{PTAT} = \frac{V_{T}\ln n}{R_{1}}$

The current I_(PTAT) flows through a resistor R to form V_(PTAT), and then a bias voltage V_(ptat) is formed, and the bias voltage V_(ptat) is a voltage with a positive temperature coefficient.

A third output signal is a base-emitter voltage V_(BE) of a triode with a negative temperature coefficient.

Now referring back to FIG. 1 . Preferably, in the reference voltage generation module with an adjustable temperature coefficient in the present invention, a first voltage follower B1 is arranged between a bias current output end of the band gap reference unit 11 and the temperature coefficient adjustment unit 12, a second voltage follower B2 is arranged between a first voltage output end of the band gap reference unit 11 and the temperature coefficient adjustment unit 12, and/or a third voltage follower B3 is arranged on an output end of the voltage superimposing unit 14. All the first voltage follower B1, the second voltage follower B2, and the third voltage follower B3 has the functions of buffering and improving a driving capability.

In an embodiment, the bias voltage V_(ptat) flows through the first voltage follower B1 to form a voltage V_(ptat_Buf), where the voltage V_(ptat_Buf) and the bias voltage V_(ptat) have the same magnitude and the same temperature coefficient. Similarly, the first voltage V_(be) and a voltage Vbe_Buf also have the same voltage and the same temperature coefficient. Therefore, a difference between voltages on two input ends of the temperature coefficient adjustment unit 12 is:

V_(total) = V_(ptat_(Buf)) − V_(be_(Buf)) = V_(ptat) − V_(be)

In FIG. 1 , the first output value and the second output value are outputted by one or more registers. For example, the first output value corresponds to a temperature coefficient adjustment signal <0:X> (e.g., TRIM_TEMPC<0:X> in FIG. 1 ), the second output value corresponds to a voltage adjustment signal <0:Y> (e.g., TRIM_VREF0 <0:Y> in FIG. 1 ). An output signal of the reference voltage generation module is V_(REF) (i.e., reference voltage V_(ref)). The band gap reference unit 11 may be implemented using a bipolar junction transistor (BJT) (e.g., as shown in FIG. 2 ). The first voltage V_(be) outputted by the band gap reference unit is a voltage between a base and an emitter of a bipolar transistor in the band gap reference unit 11 and is the third output signal of the band gap reference unit 11. The second output signal of the band gap reference unit 11 is the bias current I_(ref1), which is in direct proportion to the absolute temperature. The current flows through the bias resistor R to generate the bias voltage V_(ptat) with a positive temperature coefficient.

Referring to FIG. 3 , in the reference voltage generation module with an adjustable temperature coefficient in the present invention, a circuit structure of the temperature coefficient adjustment unit 12 includes: a first initial resistor R0, a first base resistor R_(base), at least voltage divider resistors R1, R2, . . . , and R(2^(n)+1) configured corresponding to gating switches S1, S2, . . . , and S(2^(n)+1) as shown. The gating switches are configured to selectively couple terminals of voltage divider resistors R1, R2, . . . , and R(2^(n)+1) to the initial reference voltage V_(ref1). As an example, one end of the first initial resistor R0 is coupled to a terminal of bias voltage V_(ptat), the other terminal of resistor R0 is coupled to a terminal of base resistor R_(base) through the voltage divider resistors R1, R2, . . . , and R(2^(n)+1); the other terminal of base resistor R_(base) is connected to a first voltage output end of the band gap reference unit 11. The first optional voltage divider resistors R1, R2, . . . , and R(2^(n)+1) are connected to the initial reference voltage V_(ref1) by the corresponding gating switches S1, S2, . . . , and S(2^(n)+1). For example, switching of the corresponding gating switches S1, S2, . . . , and S(2^(n)−1) is controlled by using the first output value (e.g., TRIM_TEMPC<0:X>) of the external register, to change a voltage value of the initial reference voltage Vref1. As an example, register TRIM_TEMPC<0:X>includes 2^(n)+1 control bits for switching the gating switches S1 through S(2^(n)+1).

As shown in FIG. 3 , there are 2^(n)+1 first optional voltage divider resistors R1, R2, . . . , and R(2^(n)+1) and 2^(n)+1 first gating switches S1, S2, . . . , and S(2^(n)+1). For example, when n=4, there are a total of 17 switches from S1 to S17. The first output value is outputted by the external register, for example, a signal TRIM_TEMPC<0:X> is 0001, so that the corresponding switch S1 is closed, and the first optional voltage divider resistors R1, R2, . . . , and R(2^(n)+1) connected between the first initial resistor R0 and the first base resistor R_(base) are connected to V_(ref1). For example, a ratio of the initial reference voltage V_(ref1) to the voltage of the temperature coefficient adjustment unit 12 and the temperature coefficient may be changed using temperature coefficient adjustment signal <0:X> (that is, the first output value), as expressed by the equations below:

V_(ref1) = Ratio * V_(total) + V_(be) = Ratio * (V_(ptat) − V_(be)) + V_(be) $T_{c} = {\frac{{\Delta V}_{{ref}1}}{\Delta T} = {{{{Ratio}*\left( {\frac{{\Delta V}_{ptat}}{\Delta T} - \frac{{\Delta V}_{be}}{\Delta T}} \right)} + \frac{{\Delta V}_{be}}{\Delta T}} = {{{Ratio}*\left( {C_{1} - C_{2}} \right)} + C_{2}}}}$

where Ratio is a coefficient variable that can be controlled and changed by the external register. As shown in FIG. 3 , when the switch S1 is closed, a voltage ratio Ratio is:

${{Ratio} = {\frac{R_{2} + R_{3} + R_{4} + \ldots + R_{2^{n} + 1} + R_{base}}{R_{0} + R_{1} + R_{2} + \ldots + R_{2^{n} + 1} + R_{base}} = {1 - \frac{R_{0} + R_{1}}{R_{0} + R_{1} + R_{2} + \ldots + R_{2^{n} + 1} + R_{base}}}}},{n \geq 1}$

where C1 is a positive temperature coefficient generated by the bias current Iref1, C2 is a negative temperature coefficient generated by Vbe, and Vbe is a constant related to a process, which is generally −1.5 mV/K.

Referring to FIG. 4 , according to an exemplary reference voltage generation module with an adjustable temperature coefficient as explained above, voltage adjustment unit 13 includes an operational amplifier OP1, an adjustable feedback subunit Rx, and a feedback resistor R11. The in-phase input terminal of the first operational amplifier OP1 is connected to a second voltage output terminal V_(bg) of band gap reference unit 11. The inverting input terminal of the first operational amplifier OP1 is connected to an output terminal of the first operational amplifier OP1 through a resistor RX, which is grounded via feedback resistor R11. The first operational amplifier OP1 outputs compensation voltage V_(ref0). The adjustable feedback subunit RX adjusts a resistance value of the adjustable feedback subunit RX according to the second output value (that is, TRIM_VREF0<0:Y>) of the external register, where V_(t)=V_(bg), and V_(ref0)=Vf/R11*(R11+Rx)=V_(bg)*(R11+Rx)/R11.

The temperature coefficient of the second voltage V_(bg) of the band gap reference unit 11 is 0. The second voltage V_(bg) flows through voltage adjustment unit 13 and compensation voltage V_(ref0) with a temperature coefficient of 0 is outputted. The value of compensation voltage V_(ref0) may be changed by adjusting the size of the adjustable feedback subunit RX by using the second output value outputted by the register.

Referring to FIG. 4 and FIG. 5 . In an embodiment, the adjustable feedback subunit RX includes a second initial resistor R0′, a second base resistor Rbase′, at least second optional voltage divider resistors R1′, R2′, . . . , and R′(2^(n)−1) connected in series between the second initial resistor R0′ and the second base resistor Rbase′, and second gating switches S1′, S2′, . . . , and S′(2^(n)−1) configured to short-circuit the corresponding second optional voltage divider resistors R1′, R2′, . . . , and R′(2^(n)−1), where one end of the second initial resistor R0′ is connected to the output end of the first operational amplifier OP1, another end of the second initial resistor R0′ is sequentially connected to one end of the feedback resistor R11 and the inverting input end of the first operational amplifier OP1 by the second optional voltage divider resistors R1′, R2′, . . . , and R′(2^(n)−1) and the second base resistor Rbase′, ends of the second optional voltage divider resistors R1′, R2′, . . . , and R′(2^(n)−1) are connected to one end of the second base resistor Rbase′ by the second gating switches S1′, S2′, . . . , and S′(2^(n)−1), and closing of the corresponding second gating switches S1′, S2′, . . . , and S′(2^(n)−1) is controlled by using the second output value TRIM_VREF0<0:Y> of the external register, to change the resistance value of the feedback subunit by changing a quantity of second optional voltage divider resistors R1′, R2′, . . . , and R′(2^(n)−1) that are short-circuited. For example, in FIG. 5 , ST is closed, resistors from R2′ to R′(2^(n)−1) are short-circuited. In this case, RX=R0′+R1′+Rbase′.

Referring to FIG. 1 and FIG. 6 , voltage superimposing unit 14 includes a second operational amplifier OP2, two first positive feedback resistors R0″, a second positive feedback resistor R″, and two negative feedback resistors R1″. A non-inverting input terminal of the second operational amplifier OP2 is connected to an output terminal of the voltage adjustment unit 13 via resistor R0″ on the left, and is also connected to an output end of the temperature coefficient adjustment unit 12 via resistor R0″ on the right. The non-inverting input terminal of the second operational amplifier OP2 is grounded via the second positive feedback resistor R″. The inverting input end of the second operational amplifier OP2 is connected to an output terminal of the second operational amplifier OP2 via negative feedback resistor R1″ on the top, and it is grounded via negative feedback resistor R1″ at the bottom. As an example, the size and electrical properties of resistors R1 in FIG. 6 may be substantially matched, or in certainly implementation may be different.

The second operational amplifier OP2 outputs reference voltage V_(ref) by superimposition through the voltage superimposing unit 14. For example, the final reference voltage V_(ref) may be described be described by Equation 1 below:

V _(ref) =V _(ref0) +V _(ref1) =V _(ref0)+Ratio*(V _(ptat) −V _(be))+V _(be)   Equation 1:

The temperature coefficient of the reference voltage Vref may be described by Equation 1 below:

$\begin{matrix} {T_{cyref} = {\frac{{\Delta V}_{ref}}{\Delta T} = {{0 + {{Ratio}*\left( {\frac{{\Delta V}_{ptat}}{\Delta T} - \frac{{\Delta V}_{be}}{\Delta T}} \right)} + \frac{{\Delta V}_{be}}{\Delta T}} = {{{Ratio}*\left( {C_{1} - C_{2}} \right)} + C_{1}}}}} & {{Equation}2} \end{matrix}$

To adjust the temperature coefficient, the temperature coefficient of the reference voltage V_(ref) may be adjusted by adjusting the first output value of the register. When the outputted reference voltage V_(ref) is also changed, the compensation voltage V_(ref0) with the temperature coefficient of 0 may be adjusted by adjusting the second output value of the register to compensate for the change of the outputted reference voltage V_(ref) caused by adjustment of the temperature coefficient. The reference voltage V_(ref) is outputted, and then voltage V_(REF) is outputted through third voltage follower B3, where the voltage V_(REF) and the reference voltage V_(ref) share the same magnitude and the same temperature coefficient.

As shown in FIG. 6 , the initial reference voltage V_(ref1) and the compensation voltage V_(ref0) are superimposed, to form a superimposed voltage V_(in) for OP2, where the superimposed voltage is calculated by using the following formula:

${V_{in} = \frac{V_{{ref}0} + V_{{ref}1}}{2}},{R^{\prime}▯R0^{''}}$

Then, the voltage is then doubled once by the second operational amplifier OP2 to output V_(out):

$V_{out} = {{\frac{R_{1}^{''} + R_{1}^{''}}{R_{1}^{''}} \times V_{f}} = {{2 \times V_{in}} = {{2 \times \frac{V_{{ref}0} + V_{{ref}1}}{2}} = {V_{{ref}0} + {V_{{ref}1}.}}}}}$

The reference voltage generation module 1 may be implemented as a part of a power supply apparatus with an adjustable temperature coefficient. Referring to FIG. 7 , the power supply apparatus with an adjustable temperature coefficient includes reference voltage generation module 1, charge pump 2, first voltage feedback resistor R01, second voltage feedback resistor R02, and comparator CMP. The reference voltage generation module 1 is configured to adjust a temperature coefficient of an output voltage thereof, compensate the voltage difference generated due to adjustment of the temperature coefficient, and provide output a reference voltage VREF

A non-inverting input end of the comparator CMP is connected to the reference voltage VRER, and the inverting input end of the comparator CMP is grounded by the first voltage feedback resistor R01 and is connected to an output end of the charge pump 2 by the second voltage feedback resistor R02, an output end of the comparator CMP is used as an input end of the charge pump 2, and the output end of the charge pump 2 is used as an output end of the power supply apparatus.

In FIG. 7 , TRIM_TEMPC<0:X> and TRIM_VREF0 <0:Y> may be configured as a first output value and a second output value of a register. The two values may be outputted by the same register or may be respectively outputted by two registers. The first output value is inputted into the reference voltage generation module 1 for adjusting the temperature coefficient of the voltage V_(REF) outputted by the module, and the second output value may be used for compensating a change in the reference voltage VREF. The reference voltage VREF passes through the comparator CMP and reaches the inverting input end of the comparator CMP with a feedback voltage VFB of a finally outputted voltage HVOUT, the reference voltage and the feedback voltage are compared by the comparator CMP, and the feedback voltage is clamped to the reference voltage BREF, so that the charge pump 2 generates a high voltage enough to drive the photoelectric detector array 3 (SPAD) to enter an avalanche point.

The voltage outputted by charge pump 2 may be described by the equation below:

${HVOUT} = {\frac{{R01} + {R02}}{R01}*V_{REF}}$

The voltage HVOUT outputted by the charger pump 2 according to Equation 1 above may be modified to:

${HVOUT} = {{\frac{{R01} + {R02}}{R01}*V_{REF}} = {\frac{{R01} + {R02}}{R01}*\left( {V_{{ref}0} + {{Ratio}*\left( {V_{ptat} - V_{be}} \right)} + V_{be}} \right)}}$

A temperature coefficient of the voltage outputted by the charger pump 2 according to Equation 2 above may further be modified as:

$T_{c\_{hvout}} = {\frac{\Delta{HVOUT}}{\Delta T} = {{\frac{{R01} + {R02}}{R01}*\left\lbrack {0 + {{Ratio}*\left( {\frac{{\Delta V}_{ptat}}{\Delta T} - \frac{{\Delta V}_{be}}{\Delta T}} \right)} + \frac{{\Delta V}_{be}}{\Delta T}} \right\rbrack} = {\frac{{R01} + {R01}}{R01}\left\lbrack {{{Ratio}*\left( {C_{1} - C_{2}} \right)} + C_{2}} \right\rbrack}}}$

where Ratio is a coefficient variable that can be controlled and changed by using the first output value of the register, C1 is a positive temperature coefficient generated by a bias current, and C2 is a negative temperature coefficient generated by a first voltage V_(be), where V_(be) is a constant related to a process, which is generally −1.5 mV/K.

In the present invention, a reference voltage V_(REF) is outputted by using the reference voltage generation module, the reference voltage V_(REF) clamps a feedback voltage of the charge pump 2 through the comparator CMP to a voltage that is equal to the reference voltage, and an output voltage of the charge pump 2 is linearly proportional to the reference voltage through the first voltage feedback resistor R01 and the second voltage feedback resistor R02.

Optionally, the reference voltage outputted by the reference voltage generation module may be formed by superimposing one or more adjustable voltages (that is, the second voltage V_(bg)) with a temperature coefficient of 0 and one or more adjustable voltages (that is, the first voltage V_(be)) with temperature coefficients being nonzero.

In certain implementations, the reference voltage outputted by the reference voltage generation module may alternatively be formed by subtracting zero or one or more voltages with a negative temperature coefficient from one or more voltages with a positive temperature coefficient.

According to some embodiments, a temperature coefficient of a voltage outputted by the charge pump 2 corresponds to a temperature coefficient of a photoelectric detector array 3 (for example, a SPAD array or a single SPAD), and the temperature coefficient of the photoelectric detector array is adjustable, to resolve a problem that the photoelectric detector array (for example, the SPAD) is triggered by mistake or a light sensing capability is reduced as temperature changes.

Based on the reference voltage generation module and the power supply apparatus, the present invention further provides a laser ranging chip, including at least one photoelectric detector array and a power supply apparatus, where a negative electrode of the photoelectric detector array is connected to an output end of the power supply apparatus, and a positive electrode of the photoelectric detector array is grounded. When there are two or more photoelectric detector arrays, the photoelectric detector arrays are connected in parallel, and the power supply apparatus supplies power to the photoelectric detector arrays. Because the reference voltage generation module and the power supply apparatus are described above in detail, details are not described herein again.

Based on the foregoing, in the present invention, a positive temperature coefficient is provided for a charge pump to output a voltage, so that the voltage changes with temperature. When the voltage is loaded on a photoelectric detector array, the voltage may be a voltage when the photoelectric detector array breaks down a critical state, to greatly improve stability, a light sensing capability, and a detection effect of a sensor during the change of the temperature. In addition, a compensation voltage can further be outputted by using a voltage adjustment unit, to compensate for a change of a reference voltage caused by adjustment of the temperature coefficient, so that the voltage outputted by the reference voltage generation module is accurately controlled at the voltage when the photoelectric detector array breaks down the critical state.

It may be understood that a person of ordinary skill in the art may make equivalent replacement or modifications according to the technical solution and the inventive concept of the present invention, and all of the replacement or modifications should all fall within the protection scope of the attached claims of the present invention.

While the above is a full description of the specific embodiments, various modifications, alternative constructions and equivalents may be used. Therefore, the above description and illustrations should not be taken as limiting the scope of the present invention which is defined by the appended claims. 

What is claimed is:
 1. A compensation system for a single-photon avalanche diode (SPAD), the system comprising: a reference voltage circuit coupled to a first input terminal and a second input terminal, the first input terminal being coupled to a reference temperature value associated with a breakdown voltage of the SPAD, the second input terminal being coupled to an operating temperature value, the reference voltage circuit being configured generate a reference voltage based at least on a difference between the reference temperature value and the operating temperature value; a comparator circuit comprising a first input and a second input, the comparator circuit being configured to generate an intermediate voltage; a charge pump circuit configured to provide a temperature compensation voltage based at least on the intermediate voltage; and a first resistor coupled to the charge pump circuit and the second input of the comparator circuit.
 2. The system of claim 1 wherein the SPAD is couple to an SPAD array comprising a plurality of SPAD units.
 3. The system of claim 1 further comprising a second resistor configured in series relative to the first resistor, the second resistor being grounded.
 4. The system of claim 3 wherein the SPAD is coupled to the temperature compensation voltage, the SPAD being configured in parallel relative to the first resistor and the second resistor.
 5. The system of claim 1 wherein the second input of the comparator circuit comprises an inverted input.
 6. The system of claim 1 wherein the reference voltage circuit comprises a first plurality of switches for generating a first voltage and second plurality of switches for generating a second voltage, first plurality of switches being coupled to a first plurality of control bits based on the reference temperature value, the second plurality of switches being coupled to a second plurality of control bits based on the operating temperature value.
 7. The system of claim 6 wherein the first plurality of switches is coupled to a first plurality of corresponding resistors, and the second plurality of switches is coupled to a second plurality of corresponding resistors.
 8. The system of claim 1 wherein the reference voltage circuit comprises: a bandgap reference circuit configured to generate intermediate reference voltages; a temperature coefficient adjustment circuit coupled to the bandgap reference circuit, the temperature coefficient adjustment circuit being configured generate a first intermediate reference voltage based at least on the operating temperature value; a voltage adjustment circuit coupled to the bandgap reference circuit, the voltage adjustment circuit being configured generate a second intermediate reference voltage based at least on the reference temperature value; and a voltage superimposing circuit configured to generate a third intermediate reference voltage using at least the first intermediate reference voltage and the second intermediate reference voltage.
 9. A reference voltage circuit for providing a reference voltage in a lidar system, the reference voltage circuit comprising: a bandgap reference circuit configured to generate intermediate reference voltages, the bandgap reference circuit comprising a plurality of bipolar junction transistors (BJTs) for providing a current proportional to absolute temperature; a temperature coefficient adjustment circuit coupled to the bandgap reference unit, the temperature coefficient adjustment circuit being configured generate a first intermediate reference voltage based at least on an operating temperature value; a voltage adjustment circuit coupled to the bandgap reference unit, the voltage adjustment circuit being configured generate a second intermediate reference voltage based at least on a reference temperature value; and a voltage superimposing circuit configured to generate a third intermediate reference voltage using at least the first intermediate reference voltage and the second intermediate reference voltage.
 10. The circuit of claim 9 wherein the temperature coefficient adjustment circuit comprises a first plurality of switches corresponding to a first plurality of resistors, the first plurality of switches being configured to operate according to the operating temperature value.
 11. The circuit of claim 10 wherein the voltage adjustment circuit comprises a second plurality of switches corresponding to a second plurality of resistors, the second plurality of switches being configured to operate according to the reference temperature value.
 12. The circuit of claim 9 the voltage adjustment circuit comprises an operational amplifier and a voltage divider circuit.
 13. The circuit of claim 12 wherein the voltage divider circuit comprises a variable resistor.
 14. A compensation system for a single-photon avalanche diode (SPAD) array, the system comprising: a reference voltage circuit coupled to a first input terminal and a second input terminal, the first input terminal being coupled to a reference temperature value associated with a breakdown voltage of the SPAD array, the second input terminal being coupled to an operating temperature value, the reference voltage circuit being configured generate a reference voltage based at least on a difference between the reference temperature value and the operating temperature value; a comparator circuit comprising a first input and a second input, the comparator is configured to generate an intermediate voltage; and a charge pump circuit configured to provide a temperature compensation voltage based at least on the intermediate voltage; wherein the reference voltage circuit comprises: a temperature coefficient adjustment circuit coupled configured generate a first intermediate reference voltage based at least on the operating temperature value; and a voltage adjustment circuit configured generate a second intermediate reference voltage based at least on the reference temperature value.
 15. The system of claim 14 wherein the reference voltage circuit further comprises a bandgap reference circuit configured to generate intermediate reference voltages, the bandgap reference circuit comprising a plurality of bipolar junction transistors (BJTs) for providing a current proportional to absolute temperature.
 16. The system of claim 14 wherein the reference voltage circuit further comprises a voltage superimposing circuit configured to generate a third intermediate reference voltage using at least the first intermediate reference voltage and the second intermediate reference voltage.
 17. The system of claim 14 further comprising a first resistor and a second resistor, the first resistor being coupled to the charge pump circuit and the second input of the comparator circuit.
 18. The system of claim 14, wherein the reference voltage circuit comprises a first plurality of switches for generating a first voltage and second plurality of switches for generating a second voltage, first plurality of switches being coupled to a first plurality of control bits based on the reference temperature value, the second plurality of switches being coupled to a second plurality of control bits based on the operating temperature value.
 19. The system of claim 14 further comprising a register for storing the reference voltage value.
 20. The system of claim 14 wherein the temperature coefficient adjustment circuit is coupled to a voltage proportional to absolute temperature. 